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[Precautions for test operation]
!

CAUTION
• Before starting test operation for system monitor, special function module monitor or ladder
monitor (bit device ON/OFF, word device present value changing, timer/counter set
value/present value changing, buffer memory present value changing), please read the manual
carefully to fully understand the operation methods.
For the devices that perform significant operations for the system, never perform test operation
to change data.
Doing so can cause accidents due to false outputs or malfunctions.